Success in the electronics business hinges on producing high-quality products and using the most cost-effective methods to do so. As the number of devices on integrated circuits continues to double ...

San Jose, Calif. — Magma Design Automation Inc. has launched the Talus automatic test pattern generation (ATPG) and Talus ATPG-X products with on-chip compression. These advanced ATPG products are ...

As chips get ever bigger and more complex, the electronic design automation (EDA) industry must innovate constantly to keep up. Engineers expect every new generation of silicon to be modeled, ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Design for test (DFT) has been around since the 1960s. The technology was developed to reduce the cost of creating a successful test for an IC. Scan design, fault models, and automatic test pattern ...