Failure analysis (FA) is an essential step for achieving sufficient yield in semiconductor manufacturing, but it’s struggling to keep pace with smaller dimensions, advanced packaging, and new power ...

AI-driven coding promised speed, but its code often fractures under pressure, leaving teams to carry the weight of failures that slow products and raise real costs. Buoyed by the rise of AI, many ...

“Volume diagnosis and debug play a key role in identifying systematic test failures caused by manufacturing defectivity, design marginalities, and test overkill. However, diagnosis tools often suffer ...