Scientists used Lorentz transmission electron microscopy (LTEM) to visualize topological defects. They were able to do so by passing electrons and observing their deflections through a thin magnetic ...

When you “snap” a photo with a point-and-shoot camera or a cell phone, you hope to obtain a blemish-free image. The makers of CMOS image sensors used in these and other electronic products have a ...

It's a read that's not safe for the squeamish: The Food and Drug Administration (FDA)’s Defect Levels Handbook vividly details the imperfections that the agency allows in the foods we eat. Altogether, ...

A technical paper titled “Accelerating Defect Predictions in Semiconductors Using Graph Neural Networks” was published by researchers at Purdue University, Indian Institute of Technology (IIT) Madras, ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

The size and performance advantages of FinFETs are leading to a general industry adoption of these 3D transistors at the more advanced technology nodes. These complex transistors, however, exacerbate ...