The eutectic structure of metals and ceramics occurs when multiple solid phases solidify from a liquid phase, forming a three-dimensional (3D) pattern through a self-organizing phenomenon.

Engineers are beginning to appreciate that, from prototypes early in the design cycle through to final system test, a digital pattern generator (DPG) speeds up system debug and therefore shortens the ...

The old adage “time is money” is highly applicable to the production testing of semiconductor devices. Every second that a wafer or chip is under test means that the next part cannot yet be tested.

Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

The picture on a TV set used to be the combined product of multiple analog systems, and since TVs had no internal diagnostics, the only way to know things were adjusted properly was to see for ...

Strategic Test’s Ultrafast UF7221, a 32-channel, 40-MHz pulse-pattern generator, whose output is compatible with ECL, PECL, TTL, LVDS, LVTTL, CMOS, and LVCMOS logic levels, fits onto a full-length PCI ...

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...