This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

Photonic chip used in this study, mounted on a transmission electron microscope sample holder and packaged with optical fibers. Credit: Yang et al. DOI: 10.1126/science.adk2489 Photonic chip used in ...

Electron microscopy (EM) has become an indispensable tool for investigating the nanoscale structure of a large range of materials, across physical and life sciences. It is vital for characterisation ...

Mohammed Hassan, associate professor of physics and optical sciences, let a group of researchers in developing the first transmission electron microscope powerful enough to capture images of electrons ...

This year, the electron microscopy community marks the 25 th anniversary of the release of the first aberration-corrected transmission electron microscope. To celebrate the occasion, this article ...

The global transmission electron microscope market is rapidly expanding due to the increasing demand for analytical and structural characterization of nanostructured materials and is projected to ...

insights from industryFernando C. Castro, Ph.D.Applications ScientistGatan In this interview, Fernando C. Castro, Ph.D., an Applications Scientist at Gatan, talks to AZoMaterials about the new ...