Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Have you stopped to consider the impact of yield on your overall product cost? Of course you did, when you considered your yield targets and set your product goals. But is it good enough to stop once ...

A study in Kagoshima, Japan has shown that the latest generation of TOPCon modules has surpassed p-type BC modules on energy yield during the initial month of a 1-year testing period, with an average ...

SK Hynix has reportedly reached a significant milestone in its pre-production trials by raising the yield rate of its sixth-generation high-bandwidth memory (HBM4) to 70%. This achievement strengthens ...