After the ISA converges, the rotor vibration amplitude Vin is gradually reduced. in V drops from 11.74 um to 2.70 um, decreasing by 77.0%. Performing FFT analysis to the rotor displacement, the 1st ...
The testing of the semiconductor dies produced by a wafer fabrication plant involves a long series of operations requiring meticulous care. The time spent performing these tests markedly affects both ...
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